厂商 :北京特博万德科技有限公司
北京 北京- 主营产品:
- 纳米粉末
- 纳米材料
- 真空设备组件
联系电话 :13810504825
商品详细描述
提供各种尺寸的硅外延片
电阻率及外延厚度都可按客户要求定制
Certificate of Quality Conformance
EPI Layer Characteristics
Substrate Characteristis
电阻率及外延厚度都可按客户要求定制
Certificate of Quality Conformance
Customer |
| ||
Product Model |
N/N+ |
Production Number |
07-3 |
Quantity |
96pcs |
Date |
|
Item |
Characteristics |
Uint |
Spec |
1.1 |
Type/Dopant |
--- |
N/PH3 |
1.2 |
Thinkness |
μm |
25±2.5 |
1.3 |
Thinkness Uniformity |
% |
<4% |
1.4 |
Resistivity |
Ohm-cm |
0.0338-0.0388 |
1.5 |
Resistivity Uniformity |
% |
<5% |
1.6 |
Haze |
--- |
None |
1.7 |
Slip Line |
Strip |
<5(total length< |
1.8 |
Scratch |
mm |
None |
1.9 |
Point DefectTotal Number |
ea |
<15 |
1.10 |
Dimple |
ea |
≤3 |
1.11 |
Stacking Fault |
ea |
<10/cm2 |
1.12 |
Orange Pell,Crack,Crows’ feet, Chip,Mound,Lamella |
--- |
None |
1.13 |
Edge Crown |
--- |
<1/3 EPI THK |
1.14 |
Foreign Matter |
--- |
None |
1.15 |
Back Surface Contamination |
--- |
None |
2.1 |
Production Way |
--- |
CZ |
2.2 |
Dopant |
--- |
Sb |
2.3 |
Diameter |
mm |
100±0.2 |
2.4 |
Resistivity |
Ohm-cm |
0.003-0.004 |
2.5 |
Crystallographic Direction |
Deg. |
<111>4±0.5 |
2.6 |
Thinkness |
μm |
460±20 |
2.7 |
TTV |
μm |
≤10 |
2.8 |
Warp/Bow |
μm |
≤30 |
2.9 |
Dislocation Density |
/cm2 |
100 |
2.10 |
Other |
--- |
SEMI Standard |
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